Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers
Identifieur interne : 000F74 ( Main/Exploration ); précédent : 000F73; suivant : 000F75Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers
Auteurs : J. Ben Youssef [France, Maroc] ; K. Bouziane [France] ; O. Koshkina [France] ; H. Le Gall [France] ; M. El Harfaoui [Maroc] ; M. El Yamani [Maroc] ; J. M. Desvignes [France] ; A. Fert [France]Source :
- Journal of magnetism and magnetic materials [ 0304-8853 ] ; 1997.
Descripteurs français
- Pascal (Inist)
- Wicri :
English descriptors
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Abstract
Copyright (c) 1996 Elsevier Science B.V. All rights reserved. The objectives of the present work were two fold: first to obtain the highest giant magnetoresistance (GMR) ratio in Co/Cu multilayers grown from the unusual process of rf diode sputtering and second, to investigate in detail correlation between GMR and texture and the interfacial roughness deduced from X-ray diffraction and AFM, respectively. Different interface structures have been induced from the change of the sputtering parameters (sputtering argon gas pressure PAr) which gave the optimal rf sputtering conditions for high GMR. From different results it is concluded that the most important parameter is interface roughness which induces a strong effect on both the GMR and the resistivity of the superlattice. A change in the tCo2 dependence of the reciprocal resistance near tCo=25 Å is attributed to an increase of the effect of the layer roughness when the tCo is going from mesoscopic (tCo>25 Å) to nanoscopic scale (tCo<25 Å).
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<series><title level="j" type="main">Journal of magnetism and magnetic materials</title>
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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Antiferromagnetic resonance</term>
<term>Cobalt</term>
<term>Copper</term>
<term>Experimental study</term>
<term>Giant magnetoresistance</term>
<term>Multilayers</term>
<term>Oscillations</term>
<term>Preparation</term>
<term>Radiofrequency sputtering</term>
<term>Roughness</term>
<term>Size effect</term>
<term>Solid-solid interfaces</term>
<term>Texture</term>
<term>Thickness</term>
<term>XRD</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Magnétorésistance géante</term>
<term>Texture</term>
<term>Rugosité</term>
<term>Interface solide solide</term>
<term>Multicouche</term>
<term>XRD</term>
<term>Résonance antiferromagnétique</term>
<term>Effet dimensionnel</term>
<term>Epaisseur</term>
<term>Etude expérimentale</term>
<term>Oscillation</term>
<term>Préparation</term>
<term>Pulvérisation haute fréquence</term>
<term>Cobalt</term>
<term>Cuivre</term>
<term>7570P</term>
<term>6835C</term>
<term>Co</term>
<term>Cu</term>
</keywords>
<keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Cobalt</term>
<term>Cuivre</term>
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<front><div type="abstract" xml:lang="en">Copyright (c) 1996 Elsevier Science B.V. All rights reserved. The objectives of the present work were two fold: first to obtain the highest giant magnetoresistance (GMR) ratio in Co/Cu multilayers grown from the unusual process of rf diode sputtering and second, to investigate in detail correlation between GMR and texture and the interfacial roughness deduced from X-ray diffraction and AFM, respectively. Different interface structures have been induced from the change of the sputtering parameters (sputtering argon gas pressure P<sub>Ar</sub>
) which gave the optimal rf sputtering conditions for high GMR. From different results it is concluded that the most important parameter is interface roughness which induces a strong effect on both the GMR and the resistivity of the superlattice. A change in the t<sub>Co</sub>
<sup>2</sup>
dependence of the reciprocal resistance near t<sub>Co</sub>
=25 Å is attributed to an increase of the effect of the layer roughness when the t<sub>Co</sub>
is going from mesoscopic (t<sub>Co</sub>
>25 Å) to nanoscopic scale (t<sub>Co</sub>
<25 Å).</div>
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